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A Novel High Volume Manufacturing Method for Defect-free and High-yield SiN Micro-sieve Membranes

Authors :
Yansong Liu
Chao Zhao
Lisong Dong
Rui Chen
Yaya Wei
Source :
Journal of Microelectronic Manufacturing, Vol 1, Iss 1 (2018)
Publication Year :
2018
Publisher :
JommPublish, 2018.

Abstract

Micro-sieves have been widely used in medical treatment, quarantine, environment, agriculture, pharmacy and food processing. However, the manufacturing and yield improvement have been difficult due to multiple challenges, such as the sieve unit release defect, cracking, and KOH corrosion. In this paper, we report process details and discuss technical difficulties which are usually the root-causes for process failures, and demonstrate a reliable and high yield production of SiNx micro-sieves processed with our novel method, which is also compatible with high volume manufacturing.

Details

Language :
English
ISSN :
25783769
Volume :
1
Issue :
1
Database :
Directory of Open Access Journals
Journal :
Journal of Microelectronic Manufacturing
Publication Type :
Academic Journal
Accession number :
edsdoj.30202f05a1d94f2fa27b22686c52bd22
Document Type :
article
Full Text :
https://doi.org/10.33079/jomm.18010103