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Characterization of Mn5Ge3 Contacts on a Shallow Ge/SiGe Heterostructure

Authors :
Troy A. Hutchins-Delgado
Sadhvikas J. Addamane
Ping Lu
Tzu-Ming Lu
Source :
Nanomaterials, Vol 14, Iss 6, p 539 (2024)
Publication Year :
2024
Publisher :
MDPI AG, 2024.

Abstract

Mn5Ge3 is a ferromagnetic phase of the Mn-Ge system that is a potential contact material for efficient spin injection and detection. Here, we investigate the creation of Mn5Ge3-based contacts on a Ge/SiGe quantum well heterostructure via solid-state synthesis. X-ray diffraction spectra fitting indicates the formation of Mn5Ge3-based contacts on bulk Ge and Ge/SiGe. High-resolution scanning transmission electron microscopy imaging and energy dispersive X-ray spectroscopy verify the correct Mn5Ge3-based phase formation. Schottky diode measurements, transmission line measurements, and Hall measurements reveal that Mn5Ge3-based contacts serve as good p-type contacts for Ge/SiGe quantum well heterostructures due to having a low Schottky barrier height of 0.10eV (extracted from a Mn5Ge3/n-Ge analogue) and a contact resistance in the order of 1 kΩ. Furthermore, we show that these electrical characteristics have a gate-voltage dependence, thereby providing tunability.

Details

Language :
English
ISSN :
20794991
Volume :
14
Issue :
6
Database :
Directory of Open Access Journals
Journal :
Nanomaterials
Publication Type :
Academic Journal
Accession number :
edsdoj.2ea7af2ad10e4b6393f550e7894dd3b9
Document Type :
article
Full Text :
https://doi.org/10.3390/nano14060539