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Multiscale Modeling for Application-Oriented Optimization of Resistive Random-Access Memory

Authors :
Paolo La Torraca
Francesco Maria Puglisi
Andrea Padovani
Luca Larcher
Source :
Materials, Vol 12, Iss 21, p 3461 (2019)
Publication Year :
2019
Publisher :
MDPI AG, 2019.

Abstract

Memristor-based neuromorphic systems have been proposed as a promising alternative to von Neumann computing architectures, which are currently challenged by the ever-increasing computational power required by modern artificial intelligence (AI) algorithms. The design and optimization of memristive devices for specific AI applications is thus of paramount importance, but still extremely complex, as many different physical mechanisms and their interactions have to be accounted for, which are, in many cases, not fully understood. The high complexity of the physical mechanisms involved and their partial comprehension are currently hampering the development of memristive devices and preventing their optimization. In this work, we tackle the application-oriented optimization of Resistive Random-Access Memory (RRAM) devices using a multiscale modeling platform. The considered platform includes all the involved physical mechanisms (i.e., charge transport and trapping, and ion generation, diffusion, and recombination) and accounts for the 3D electric and temperature field in the device. Thanks to its multiscale nature, the modeling platform allows RRAM devices to be simulated and the microscopic physical mechanisms involved to be investigated, the device performance to be connected to the material’s microscopic properties and geometries, the device electrical characteristics to be predicted, the effect of the forming conditions (i.e., temperature, compliance current, and voltage stress) on the device’s performance and variability to be evaluated, the analog resistance switching to be optimized, and the device’s reliability and failure causes to be investigated. The discussion of the presented simulation results provides useful insights for supporting the application-oriented optimization of RRAM technology according to specific AI applications, for the implementation of either non-volatile memories, deep neural networks, or spiking neural networks.

Details

Language :
English
ISSN :
19961944
Volume :
12
Issue :
21
Database :
Directory of Open Access Journals
Journal :
Materials
Publication Type :
Academic Journal
Accession number :
edsdoj.27e00775cdd44a908f9888313ff88e07
Document Type :
article
Full Text :
https://doi.org/10.3390/ma12213461