Back to Search
Start Over
Guest Editorial Special Section on Signal Processing and Machine Learning in Intelligent Instrumentation, IEEE Open Journal of Instrumentation and Measurement
- Source :
- IEEE Open Journal of Instrumentation and Measurement, Vol 2, Pp 1-2 (2023)
- Publication Year :
- 2023
- Publisher :
- IEEE, 2023.
-
Abstract
- There has been tremendous interest in the development and deployment of Signal Processing and Machine Learning algorithms for almost all areas of instrumentation and measurement systems, starting from power systems, transportation, biomedical and healthcare, industrial measurements and automation, robotics and mechatronics, smart infrastructure, and facility management to aerospace and navigation. Their combination, signal processing and machine learning, is expected to dominate the next decade industrial developments. In order to embed the “intelligence” into the measurement, signal processing has been one of the ubiquitous techniques for quite some time. Machine learning methods make these intelligent methods “experienced.” Because machine learning has been around in recent years, signal processing software–hardware systems equipped with machine learning are relatively mature. In this Special Section, a call for paper included (but were not limited to) the following areas.
Details
- Language :
- English
- ISSN :
- 27687236
- Volume :
- 2
- Database :
- Directory of Open Access Journals
- Journal :
- IEEE Open Journal of Instrumentation and Measurement
- Publication Type :
- Academic Journal
- Accession number :
- edsdoj.25568c5cf44a4f2094bf547eb1ba6131
- Document Type :
- article
- Full Text :
- https://doi.org/10.1109/OJIM.2023.3334827