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Synthesis science of SrRuO3 and CaRuO3 epitaxial films with high residual resistivity ratios

Authors :
Hari P. Nair
Yang Liu
Jacob P. Ruf
Nathaniel J. Schreiber
Shun-Li Shang
David J. Baek
Berit H. Goodge
Lena F. Kourkoutis
Zi-Kui Liu
Kyle M. Shen
Darrell G. Schlom
Source :
APL Materials, Vol 6, Iss 4, Pp 046101-046101-11 (2018)
Publication Year :
2018
Publisher :
AIP Publishing LLC, 2018.

Abstract

Epitaxial SrRuO3 and CaRuO3 films were grown under an excess flux of elemental ruthenium in an adsorption-controlled regime by molecular-beam epitaxy (MBE), where the excess volatile RuOx (x = 2 or 3) desorbs from the growth front leaving behind a single-phase film. By growing in this regime, we were able to achieve SrRuO3 and CaRuO3 films with residual resistivity ratios (ρ300 K/ρ4 K) of 76 and 75, respectively. A combined phase stability diagram based on the thermodynamics of MBE (TOMBE) growth, termed a TOMBE diagram, is employed to provide improved guidance for the growth of complex materials by MBE.

Details

Language :
English
ISSN :
2166532X
Volume :
6
Issue :
4
Database :
Directory of Open Access Journals
Journal :
APL Materials
Publication Type :
Academic Journal
Accession number :
edsdoj.20b4ab3530f9403aa1044d24b93d7d1d
Document Type :
article
Full Text :
https://doi.org/10.1063/1.5023477