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Scanning probe microscopy and related methods

Authors :
Ernst Meyer
Source :
Beilstein Journal of Nanotechnology, Vol 1, Iss 1, Pp 155-157 (2010)
Publication Year :
2010
Publisher :
Beilstein-Institut, 2010.

Details

Language :
English
ISSN :
21904286
Volume :
1
Issue :
1
Database :
Directory of Open Access Journals
Journal :
Beilstein Journal of Nanotechnology
Publication Type :
Academic Journal
Accession number :
edsdoj.1fc987b2210847d6a47c4110c14e6239
Document Type :
article
Full Text :
https://doi.org/10.3762/bjnano.1.18