Retrieving the size of particles with rough surfaces from 2D scattering patterns

Frequency analysis can be used for the recovery of particle properties such as size from scattering data, but is difficult to apply in practice, as lack of completeness or discontinuities at boundaries can produce artifacts. For 2D scattering patterns image processing, including morphological operations, offers an alternative approach. We test possible techniques on a diverse range of particles. It is found that the average surface area of intensity peaks is inversely proportional to particle size.