Development of a Portable Optomechatronic System to Obtain the Characterization of Transparent Materials and Dielectric Thin Films

This paper outlines the design and fabrication of a portable optomechatronic system based on the theta-2theta configuration, which explores various optical characterization techniques for transparent materials and dielectric thin films. These techniques include Brewster angle and Abelès-Brewster angle measurements, critical angle measurements, and the surface plasmon resonance technique. The system consists of a mechanical assembly of rotating stages, a semiconductor laser, a photodiode connected to a data acquisition card, and a user interface for controlling the stepper motor rotation stages. Utilizing a BK7 substrate, the motorized stage achieved a resolution of 0.010. The Brewster angle measured was 56.550, with a refractive index (n) of 1.5137. The relative error obtained was Δn/n = 3.82 × 10−4, with a sensitivity of 164.27 RIU/degree and an accuracy of 0.37/degree. Furthermore, the discrepancies between theoretical and experimental refractive indices for different prisms at 639 nm ranged from ±7 × 10−4 to ±73 × 10−4. After testing various samples, the system demonstrated its capability to perform fast, precise, and non-invasive measurements. Its portability allows for use in diverse environments and applications.