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The Effects of Irradiation on Structure and Leaching of Pure and Doped Thin-Film Ceria SIMFUEL Models Prepared via Polymer-Templated Deposition

Authors :
Alistair F. Holdsworth
Zizhen Feng
Ruth Edge
John P. Waters
Alice M. Halman
David Collison
Kathryn George
Louise S. Natrajan
Melissa A. Denecke
Source :
Journal of Nuclear Engineering, Vol 5, Iss 2, Pp 150-167 (2024)
Publication Year :
2024
Publisher :
MDPI AG, 2024.

Abstract

When studying hazardous materials such as spent nuclear fuel (SNF), the minimisation of sample volumes is essential, together with the use of chemically-similar surrogates where possible. For example, the bulk behaviour of urania (UO2) can be mimicked by appropriately-engineered thin films of sufficient thickness, and inactive materials such as ceria (CeO2) can be used to study the effects within radioactive systems used to fuel nuclear fission. However, thin film properties are sensitive to the preparative method, many of which require the use of highly toxic precursors and specialised apparatus (e.g., chemical vapour deposition). To address this, we present the development of a flexible, tuneable, scalable method for the preparation of thin-film CeO2 SIMFUEL models with a thickness of ≈5 μm. The effects of γ irradiation (up to 100 kGy) and dopants including trivalent lanthanides (Ln3+) and simulant ε-particles on the structure and long-term leaching of these systems under SNF storage conditions were explored, alongside the context of this within further work. It was found that the sensitivity of CeO2 films to reduction upon irradiation, particularly in the presence of simulant ε-particles, resulted in increased leaching of Ce (as CeIII), while trivalent lanthanides (Nd3+ and Eu3+) had a minimal effect on Ce leaching.

Details

Language :
English
ISSN :
26734362
Volume :
5
Issue :
2
Database :
Directory of Open Access Journals
Journal :
Journal of Nuclear Engineering
Publication Type :
Academic Journal
Accession number :
edsdoj.12768b8bcf6f4f36bdaf9815d70bdb98
Document Type :
article
Full Text :
https://doi.org/10.3390/jne5020011