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PID Testing Method Suitable for Process Control of Solar Cells Mass Production

Authors :
Xianfang Gou
Xiaoyan Li
Su Zhou
Shaoliang Wang
Weitao Fan
Qingsong Huang
Source :
International Journal of Photoenergy, Vol 2015 (2015)
Publication Year :
2015
Publisher :
Wiley, 2015.

Abstract

Voltage bias of several hundred volts which are applied between solar cells and module frames may lead to significant power losses, so-called potential-induced degradation (PID), in normal photovoltaic (PV) installations system. Modules and minimodules are used to conduct PID test of solar cells. The test procedure is time consuming and of high cost, which cannot be used as process monitoring method during solar cells fabrication. In this paper, three kinds of test including minimodule, Rsh, and V-Q test are conducted on solar cells or wafers with SiNx of different refractive index. All comparisons between test results of Rsh, V-Q, and minimodule tests have shown equal results. It is shown that Rsh test can be used as quality inspection of solar cells and V-Q test of coated wafer can be used as process control of solar cells.

Subjects

Subjects :
Renewable energy sources
TJ807-830

Details

Language :
English
ISSN :
1110662X and 1687529X
Volume :
2015
Database :
Directory of Open Access Journals
Journal :
International Journal of Photoenergy
Publication Type :
Academic Journal
Accession number :
edsdoj.0d1ff471f0e246a8a010fdc971df754f
Document Type :
article
Full Text :
https://doi.org/10.1155/2015/863248