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Analysis of Current Research Status of Plasma Etch Process Model

Authors :
Xiaoting Li
Rui Chen
Lei Qu
Xuanmin Zhu
Jing Zhang
Yanrong Wang
Shuhua Wei
Jiang Yan
Yayi Wei
Source :
Journal of Microelectronic Manufacturing, Vol 1, Iss 1 (2018)
Publication Year :
2018
Publisher :
JommPublish, 2018.

Abstract

This paper summarizes the status of the plasma etch process modeling research. It mainly introduces typical etching models employing the analytical method, geometric method, system identification method, basic principle simulation method, as well as empirical model. Each model’s basic principles, application scopes, advantages and disadvantages are discussed. Based on these, the development history of the etch process modeling is summarized, and the development opportunities of the etch model are prospected. This paper provides a brief view for establishment of the plasma etching process model.

Details

Language :
English
ISSN :
25783769
Volume :
1
Issue :
1
Database :
Directory of Open Access Journals
Journal :
Journal of Microelectronic Manufacturing
Publication Type :
Academic Journal
Accession number :
edsdoj.0b1c23c752ba458da338bc87f6a5ac6b
Document Type :
article
Full Text :
https://doi.org/10.33079/jomm.18010104