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Signal generation in dynamic interferometric displacement detection

Authors :
Knarik Khachatryan
Simon Anter
Michael Reichling
Alexander von Schmidsfeld
Source :
Beilstein Journal of Nanotechnology, Vol 15, Iss 1, Pp 1070-1076 (2024)
Publication Year :
2024
Publisher :
Beilstein-Institut, 2024.

Abstract

Laser interferometry is a well-established and widely used technique for precise displacement measurements. In a non-contact atomic force microscope (NC-AFM), it facilitates the force measurement by recording the periodic displacement of an oscillating microcantilever. To understand signal generation in a NC-AFM-based Michelson-type interferometer, we evaluate the non-linear response of the interferometer to the harmonic displacement of the cantilever in the time domain. As the interferometer signal is limited in amplitude because of the spatial periodicity of the interferometer light field, an increasing cantilever oscillation amplitude creates an output signal with an increasingly complex temporal structure. By the fit of a model to the measured time-domain signal, all parameters governing the interferometric displacement signal can precisely be determined. It is demonstrated, that such an analysis specifically allows for the calibration of the cantilever oscillation amplitude with 2% accuracy.

Details

Language :
English
ISSN :
21904286
Volume :
15
Issue :
1
Database :
Directory of Open Access Journals
Journal :
Beilstein Journal of Nanotechnology
Publication Type :
Academic Journal
Accession number :
edsdoj.0400cf4bed749aaaaa88cbc51bf4939
Document Type :
article
Full Text :
https://doi.org/10.3762/bjnano.15.87