Plasmonic-nanowire near-field beam analyzer

Experimental near-field analysis of the output beams from the end faces of micro/nano-waveguide is very necessary, because important information such as spatial intensity distributions, mode orders, and divergence angles can be obtained, and are very important for investigating and designing nanophotonic devices. However, as far as we know, it has not been demonstrated yet. In this work, we experimentally demonstrate a plasmonic-nanowire near-field beam analyzer, utilizing a single Au nanowire (AuNW) as the probe to scan the spatial near-field distributions of emitted beams from micro/nano-waveguide end-faces. Our analyzer can resolve the trade-off between high measurement resolution and light collection efficiency in conventional beam analyzers by a reverse nanofocusing process, achieving a probe resolution of 190 nm (