Self-Heating in FDSOI UTBB MOSFETs at Cryogenic Temperatures and its Effect on Analog Figures of Merit

MLA

Lucas Nyssens, et al. “Self-Heating in FDSOI UTBB MOSFETs at Cryogenic Temperatures and Its Effect on Analog Figures of Merit.” IEEE Journal of the Electron Devices Society, vol. 8, Jan. 2020, pp. 789–96. EBSCOhost, https://doi.org/10.1109/JEDS.2020.2999632.

APA

Lucas Nyssens, Arka Halder, Babak Kazemi Esfeh, Nicolas Planes, Michel Haond, Denis Flandre, Jean-Pierre Raskin, & Valeriya Kilchytska. (2020). Self-Heating in FDSOI UTBB MOSFETs at Cryogenic Temperatures and its Effect on Analog Figures of Merit. IEEE Journal of the Electron Devices Society, 8, 789–796. https://doi.org/10.1109/JEDS.2020.2999632

Chicago

Lucas Nyssens, Arka Halder, Babak Kazemi Esfeh, Nicolas Planes, Michel Haond, Denis Flandre, Jean-Pierre Raskin, and Valeriya Kilchytska. 2020. “Self-Heating in FDSOI UTBB MOSFETs at Cryogenic Temperatures and Its Effect on Analog Figures of Merit.” IEEE Journal of the Electron Devices Society 8 (January): 789–96. doi:10.1109/JEDS.2020.2999632.