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MBL-CPDP: A Multi-objective Bilevel Method for Cross-Project Defect Prediction via Automated Machine Learning

Authors :
Chen, Jiaxin
Ding, Jinliang
Tan, Kay Chen
Qian, Jiancheng
Li, Ke
Publication Year :
2024

Abstract

Cross-project defect prediction (CPDP) leverages machine learning (ML) techniques to proactively identify software defects, especially where project-specific data is scarce. However, developing a robust ML pipeline with optimal hyperparameters that effectively use cross-project information and yield satisfactory performance remains challenging. In this paper, we resolve this bottleneck by formulating CPDP as a multi-objective bilevel optimization (MBLO) method, dubbed MBL-CPDP. It comprises two nested problems: the upper-level, a multi-objective combinatorial optimization problem, enhances robustness and efficiency in optimizing ML pipelines, while the lower-level problem is an expensive optimization problem that focuses on tuning their optimal hyperparameters. Due to the high-dimensional search space characterized by feature redundancy and inconsistent data distributions, the upper-level problem combines feature selection, transfer learning, and classification to leverage limited and heterogeneous historical data. Meanwhile, an ensemble learning method is proposed to capture differences in cross-project distribution and generalize across diverse datasets. Finally, a MBLO algorithm is presented to solve this problem while achieving high adaptability effectively. To evaluate the performance of MBL-CPDP, we compare it with five automated ML tools and $50$ CPDP techniques across $20$ projects. Extensive empirical results show that MBL-CPDPoutperforms the comparison methods, demonstrating its superior adaptability and comprehensive performance evaluation capability.<br />Comment: 37 pages

Details

Database :
arXiv
Publication Type :
Report
Accession number :
edsarx.2411.06491
Document Type :
Working Paper