Size Effect on Raman Measured Stress and Strain Induced Phonon Shifts in Ultra-Thin Film Silicon

MLA

Pashartis, Christopher, et al. Size Effect on Raman Measured Stress and Strain Induced Phonon Shifts in Ultra-Thin Film Silicon. 2024. EBSCOhost, https://doi.org/10.1063/5.0240392.

APA

Pashartis, C., van Setten, M. J., & Pourtois, G. (2024). Size Effect on Raman Measured Stress and Strain Induced Phonon Shifts in Ultra-Thin Film Silicon. https://doi.org/10.1063/5.0240392

Chicago

Pashartis, Christopher, Michiel J. van Setten, and Geoffrey Pourtois. 2024. “Size Effect on Raman Measured Stress and Strain Induced Phonon Shifts in Ultra-Thin Film Silicon.” doi:10.1063/5.0240392.