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Impact of external magnetic fields on STT-MRAM

Authors :
Dieny, Bernard
Aggarwal, Sanjeev
Naik, Vinayak Bharat
Couet, Sebastien
Coughlin, Thomas
Fukami, Shunsuke
Garello, Kevin
Guedj, Jack
Incorvia, Jean Anne C.
Lebrun, Laurent
Lee, Kyung-Jin
Leonelli, Daniele
Noh, Yonghwan
Salimy, Siamak
Soss, Steven
Thomas, Luc
Wang, Weigang
Worledge, Daniel
Publication Year :
2024

Abstract

This application note discusses the working principle of spin-transfer torque magnetoresistive random access memory (STT-MRAM) and the impact that magnetic fields can have on STT-MRAM operation. Sources of magnetic field and typical magnitudes of magnetic fields are given. Based on the magnitude of commonly encountered external magnetic fields, we show below that magnetic immunity of STT-MRAM is sufficient for most uses once the chip is mounted on a printed circuit board (PCB) or inserted in its working environment. This statement is supported by the experience acquired during 60 years of use of magnetic hard disk drives (HDD) including 20 years of HDD with readers comprising magnetic tunnel junctions, 20+ years of use of magnetic field sensors as position encoders in automotive industry and 15+ years of use of MRAM. Mainly during chip handling does caution need to be exercised to avoid exposing the chip to excessively high magnetic fields.

Subjects

Subjects :
Physics - Applied Physics

Details

Database :
arXiv
Publication Type :
Report
Accession number :
edsarx.2409.05584
Document Type :
Working Paper