Cite
Stacking fault segregation imaging with analytical field ion microscopy
MLA
Morgado, F. F., et al. Stacking Fault Segregation Imaging with Analytical Field Ion Microscopy. 2024. EBSCOhost, widgets.ebscohost.com/prod/customlink/proxify/proxify.php?count=1&encode=0&proxy=&find_1=&replace_1=&target=https://search.ebscohost.com/login.aspx?direct=true&site=eds-live&scope=site&db=edsarx&AN=edsarx.2408.03167&authtype=sso&custid=ns315887.
APA
Morgado, F. F., Stephenson, L. T., Bhatt, S., Freysoldt, C., Neumeier, S., Katnagallu, S., Subramanyam, A. P. A., Pietka, I., Hammerschmidt, T., Vurpillot, F., & Gault, B. (2024). Stacking fault segregation imaging with analytical field ion microscopy.
Chicago
Morgado, F. F., L. T. Stephenson, S. Bhatt, C. Freysoldt, S. Neumeier, S. Katnagallu, A. P. A. Subramanyam, et al. 2024. “Stacking Fault Segregation Imaging with Analytical Field Ion Microscopy.” http://widgets.ebscohost.com/prod/customlink/proxify/proxify.php?count=1&encode=0&proxy=&find_1=&replace_1=&target=https://search.ebscohost.com/login.aspx?direct=true&site=eds-live&scope=site&db=edsarx&AN=edsarx.2408.03167&authtype=sso&custid=ns315887.