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Measurement-device agnostic quantum tomography

Authors :
Stárek, Robert
Bielak, Martin
Ježek, Miroslav
Publication Year :
2024

Abstract

Characterization of quantum states and devices is paramount to quantum science and technology. The characterization consists of individual measurements, which are required to be precisely known. A mismatch between actual and assumed constituent measurements limits the accuracy of this characterization. Here, we show that such a mismatch introduces reconstruction artifacts in quantum state tomography. We use these artifacts to detect and quantify the mismatch and gain information about the actual measurement operators. It consequently allows the mitigation of systematic errors in quantum measurement and state preparation.<br />Comment: main text: 8 pages, 2 figures, SM: 7 pages, 7 figures

Subjects

Subjects :
Quantum Physics

Details

Database :
arXiv
Publication Type :
Report
Accession number :
edsarx.2407.13011
Document Type :
Working Paper