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Application of Probabilistic-bit in Precision Measurements
- Publication Year :
- 2024
-
Abstract
- We propose a novel approach for precision measurement utilizing an ensemble of probabilistic bits (p-bits). This method leverages the inherent fluctuations of p-bits to achieve high sensitivity in various applications, including magnetic field sensing, temperature monitoring and timekeeping. The sensitivity scales proportionally to the square root of the total number of p-bits, enabling unprecedented accuracy with large ensembles. Furthermore, the robustness of this method against device imperfections and non-uniformity enhances its practicality and scalability. This work paves the way for a new paradigm in precision measurement, offering a cost-effective and versatile alternative to traditional methods.<br />Comment: 5 pages, 2 figures
Details
- Database :
- arXiv
- Publication Type :
- Report
- Accession number :
- edsarx.2405.08382
- Document Type :
- Working Paper