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Lightweight, error-tolerant edge detection using memristor-enabled stochastic logics

Authors :
Song, Lekai
Liu, Pengyu
Pei, Jingfang
Liu, Yang
Liu, Songwei
Wang, Shengbo
Ng, Leonard W. T.
Hasan, Tawfique
Pun, Kong-Pang
Gao, Shuo
Hu, Guohua
Publication Year :
2024

Abstract

The demand for efficient edge vision has spurred the interest in developing stochastic computing approaches for performing image processing tasks. Memristors with inherent stochasticity readily introduce probability into the computations and thus enable stochastic image processing computations. Here, we present a stochastic computing approach for edge detection, a fundamental image processing technique, facilitated with memristor-enabled stochastic logics. Specifically, we integrate the memristors with logic circuits and harness the stochasticity from the memristors to realize compact stochastic logics for stochastic number encoding and processing. The stochastic numbers, exhibiting well-regulated probabilities and correlations, can be processed to perform logic operations with statistical probabilities. This can facilitate lightweight stochastic edge detection for edge visual scenarios characterized with high-level noise errors. As a practical demonstration, we implement a hardware stochastic Roberts cross operator using the stochastic logics, and prove its exceptional edge detection performance, remarkably, with 95% less computational cost while withstanding 50% bit-flip errors. The results underscore the great potential of our stochastic edge detection approach in developing lightweight, error-tolerant edge vision hardware and systems for autonomous driving, virtual/augmented reality, medical imaging diagnosis, industrial automation, and beyond.

Details

Database :
arXiv
Publication Type :
Report
Accession number :
edsarx.2402.16908
Document Type :
Working Paper