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Interferometric Single-Shot Parity Measurement in an InAs-Al Hybrid Device

Authors :
Aghaee, Morteza
Ramirez, Alejandro Alcaraz
Alam, Zulfi
Ali, Rizwan
Andrzejczuk, Mariusz
Antipov, Andrey
Astafev, Mikhail
Barzegar, Amin
Bauer, Bela
Becker, Jonathan
Bhaskar, Umesh Kumar
Bocharov, Alex
Boddapati, Srini
Bohn, David
Bommer, Jouri
Bourdet, Leo
Bousquet, Arnaud
Boutin, Samuel
Casparis, Lucas
Chapman, Benjamin James
Chatoor, Sohail
Christensen, Anna Wulff
Chua, Cassandra
Codd, Patrick
Cole, William
Cooper, Paul
Corsetti, Fabiano
Cui, Ajuan
Dalpasso, Paolo
Dehollain, Juan Pablo
de Lange, Gijs
de Moor, Michiel
Ekefjärd, Andreas
Dandachi, Tareq El
Saldaña, Juan Carlos Estrada
Fallahi, Saeed
Galletti, Luca
Gardner, Geoff
Govender, Deshan
Griggio, Flavio
Grigoryan, Ruben
Grijalva, Sebastian
Gronin, Sergei
Gukelberger, Jan
Hamdast, Marzie
Hamze, Firas
Hansen, Esben Bork
Heedt, Sebastian
Heidarnia, Zahra
Zamorano, Jesús Herranz
Ho, Samantha
Holgaard, Laurens
Hornibrook, John
Indrapiromkul, Jinnapat
Ingerslev, Henrik
Ivancevic, Lovro
Jensen, Thomas
Jhoja, Jaspreet
Jones, Jeffrey
Kalashnikov, Konstantin V.
Kallaher, Ray
Kalra, Rachpon
Karimi, Farhad
Karzig, Torsten
King, Evelyn
Kloster, Maren Elisabeth
Knapp, Christina
Kocon, Dariusz
Koski, Jonne
Kostamo, Pasi
Kumar, Mahesh
Laeven, Tom
Larsen, Thorvald
Lee, Jason
Lee, Kyunghoon
Leum, Grant
Li, Kongyi
Lindemann, Tyler
Looij, Matthew
Love, Julie
Lucas, Marijn
Lutchyn, Roman
Madsen, Morten Hannibal
Madulid, Nash
Malmros, Albert
Manfra, Michael
Mantri, Devashish
Markussen, Signe Brynold
Martinez, Esteban
Mattila, Marco
McNeil, Robert
Mei, Antonio B.
Mishmash, Ryan V.
Mohandas, Gopakumar
Mollgaard, Christian
Morgan, Trevor
Moussa, George
Nayak, Chetan
Nielsen, Jens Hedegaard
Nielsen, Jens Munk
Nielsen, William Hvidtfelt Padkær
Nijholt, Bas
Nystrom, Mike
O'Farrell, Eoin
Ohki, Thomas
Otani, Keita
Wütz, Brian Paquelet
Pauka, Sebastian
Petersson, Karl
Petit, Luca
Pikulin, Dima
Prawiroatmodjo, Guen
Preiss, Frank
Morejon, Eduardo Puchol
Rajpalke, Mohana
Ranta, Craig
Rasmussen, Katrine
Razmadze, David
Reentila, Outi
Reilly, David J.
Ren, Yuan
Reneris, Ken
Rouse, Richard
Sadovskyy, Ivan
Sainiemi, Lauri
Sanlorenzo, Irene
Schmidgall, Emma
Sfiligoj, Cristina
Shah, Mustafeez Bashir
Simoes, Kevin
Singh, Shilpi
Sinha, Sarat
Soerensen, Thomas
Sohr, Patrick
Stankevic, Tomas
Stek, Lieuwe
Stuppard, Eric
Suominen, Henri
Suter, Judith
Teicher, Sam
Thiyagarajah, Nivetha
Tholapi, Raj
Thomas, Mason
Toomey, Emily
Tracy, Josh
Turley, Michelle
Upadhyay, Shivendra
Urban, Ivan
Van Hoogdalem, Kevin
Van Woerkom, David J.
Viazmitinov, Dmitrii V.
Vogel, Dominik
Watson, John
Webster, Alex
Weston, Joseph
Winkler, Georg W.
Xu, Di
Yang, Chung Kai
Yucelen, Emrah
Zeisel, Roland
Zheng, Guoji
Zilke, Justin
Publication Year :
2024

Abstract

The fusion of non-Abelian anyons or topological defects is a fundamental operation in measurement-only topological quantum computation. In topological superconductors, this operation amounts to a determination of the shared fermion parity of Majorana zero modes. As a step towards this, we implement a single-shot interferometric measurement of fermion parity in indium arsenide-aluminum heterostructures with a gate-defined nanowire. The interferometer is formed by tunnel-coupling the proximitized nanowire to quantum dots. The nanowire causes a state-dependent shift of these quantum dots' quantum capacitance of up to 1 fF. Our quantum capacitance measurements show flux h/2e-periodic bimodality with a signal-to-noise ratio of 1 in 3.7 $\mu$s at optimal flux values. From the time traces of the quantum capacitance measurements, we extract a dwell time in the two associated states that is longer than 1 ms at in-plane magnetic fields of approximately 2 T. These results are consistent with a measurement of the fermion parity encoded in a pair of Majorana zero modes that are separated by approximately 3 $\mu$m and subjected to a low rate of poisoning by non-equilibrium quasiparticles. The large capacitance shift and long poisoning time enable a parity measurement error probability of 1%.<br />Comment: Added data on a second measurement of device A and a measurement of device B, expanded discussion of a trivial scenario. Refs added, author list updated

Details

Database :
arXiv
Publication Type :
Report
Accession number :
edsarx.2401.09549
Document Type :
Working Paper