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Deep Industrial Image Anomaly Detection: A Survey

Authors :
Liu, Jiaqi
Xie, Guoyang
Wang, Jinbao
Li, Shangnian
Wang, Chengjie
Zheng, Feng
Jin, Yaochu
Source :
Machine Intelligence Research vol. 21, no. 1, pp. 104-135, 2024
Publication Year :
2023

Abstract

The recent rapid development of deep learning has laid a milestone in industrial Image Anomaly Detection (IAD). In this paper, we provide a comprehensive review of deep learning-based image anomaly detection techniques, from the perspectives of neural network architectures, levels of supervision, loss functions, metrics and datasets. In addition, we extract the new setting from industrial manufacturing and review the current IAD approaches under our proposed our new setting. Moreover, we highlight several opening challenges for image anomaly detection. The merits and downsides of representative network architectures under varying supervision are discussed. Finally, we summarize the research findings and point out future research directions. More resources are available at https://github.com/M-3LAB/awesome-industrial-anomaly-detection.

Details

Database :
arXiv
Journal :
Machine Intelligence Research vol. 21, no. 1, pp. 104-135, 2024
Publication Type :
Report
Accession number :
edsarx.2301.11514
Document Type :
Working Paper
Full Text :
https://doi.org/10.1007/s11633-023-1459-z