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Machine learning for classifying and interpreting coherent X-ray speckle patterns

Authors :
Shen, Mingren
Sheyfer, Dina
Loeffler, Troy David
Sankaranarayanan, Subramanian K. R. S.
Stephenson, G. Brian
Chan, Maria K. Y.
Morgan, Dane
Publication Year :
2022

Abstract

Speckle patterns produced by coherent X-ray have a close relationship with the internal structure of materials but quantitative inversion of the relationship to determine structure from speckle patterns is challenging. Here, we investigate the link between coherent X-ray speckle patterns and sample structures using a model 2D disk system and explore the ability of machine learning to learn aspects of the relationship. Specifically, we train a deep neural network to classify the coherent X-ray speckle patterns according to the disk number density in the corresponding structure. It is demonstrated that the classification system is accurate for both non-disperse and disperse size distributions.

Details

Database :
arXiv
Publication Type :
Report
Accession number :
edsarx.2211.08194
Document Type :
Working Paper