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Soft x-ray irradiation induced metallization of layered TiNCl
- Publication Year :
- 2020
-
Abstract
- We have performed soft x-ray spectroscopy in order to study the photoirradiation time dependence of the valence band structure and chemical states of layered transition metal nitride chloride TiNCl. Under the soft x-ray irradiation, the intensities of the states near the Fermi level (EF) and the Ti3+ component increased, while the Cl 2p intensity decreased. Ti 2p-3d resonance photoemission spectroscopy confirmed a distinctive Fermi edge with Ti 3d character. These results indicate the photo-induced metallization originates from deintercalation due to Cl desorption, and thus provide a new carrier doping method that controls the conducting properties of TiNCl.
Details
- Database :
- arXiv
- Publication Type :
- Report
- Accession number :
- edsarx.2010.01846
- Document Type :
- Working Paper
- Full Text :
- https://doi.org/10.1088/1361-648X/abbbc3