The limits of Near Field Immersion Microwave Microscopy evaluated by imaging bilayer graphene Moir\'{e} patterns

Molecular and atomic imaging required the development of electron and scanning probe microscopies to surpass the physical limits dictated by diffraction. Nano-infrared experiments and pico-cavity tip-enhanced Raman spectroscopy imaging later demonstrated that radiation in the visible range can surpass this limit by using scanning probe tips to access the near-field regime. Here we show that ultimate resolution can be obtained by using scanning microwave imaging microscopy to reveal structures with feature sizes down to 1~nm using a radiation of 0.1~m in wavelength. As a test material we use twisted bilayer graphene, which is not only a very important recent topic due to the discovery of correlated electron effects such as superconductivity, but also because it provides a sample where we can systematically tune a superstructure Moir\'e patterns modulation from below one up to tens of nanometers. By analyzing the tip-sample distance dynamics, we demonstrate that this ultimate 10$^8$ probe-to-pattern resolution can be achieved by using liquid immersion microscopy concepts and exquisite force control exerted on nanoscale water menisci.
Comment: suppl. mat included, movies not included and available upon request by email to gilberto@dcc.ufmg.br