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Crystal plasticity analysis of deformation anisotropy of lamellar TiAl alloy: 3D microstructure-based modelling and in-situ micro-compression

Authors :
Chen, Liu
Edwards, Thomas Edward James
Di Gioacchino, Fabio
Clegg, William John
Dunne, Fionn P. E.
Pham, Minh-Son
Publication Year :
2019

Abstract

Detailed microstructure characterisation and in-situ micropillar compression were coupled with crystal plasticity-based finite element modelling (CP-FEM) to study the micro-mechanisms of plastic anisotropy in lamellar TiAl alloys. The consideration of microstructure in both simulation and in-situ experiments enables in-depth understanding of micro-mechanisms responsible for the highly anisotropic deformation response of TiAl on the intra-lamella and inter-lamella scales. This study focuses on two specific configurations of {\gamma}/{\alpha}_2 lamellar microstructure with the {\gamma}/{\alpha}_2 interfaces being aligned {25}^o and {55}^o to the loading direction. Microstructure-based CP-FEM shows that longituginal slip of super and ordinary dislocations are most responsible for the plastic anisotropy in the {25}^o micropillar while the anisotropy of the {55}^o micropillar is due to longitudinal superdislocations and longitudinal twins. In addition, transversal superdislocations were more active, making the deformation in the {25}^o micropillar less localised than that in the {55}^o micropillar. Moreover, the CP-FEM model successfully predicted substantial build-up of internal stresses at {\gamma}/{\alpha}_2 interfaces, which is believed to be detrimental to the ductility in TiAl. However, as evidenced by the model, the detrimental internal stresses can be significantly relieved by the activation of transverse deformation twinning, suggesting that the ductility of TiAl can be improved by promoting transverse twins.<br />Comment: 42 pages, accepted by International Journal of Plasticicty

Details

Database :
arXiv
Publication Type :
Report
Accession number :
edsarx.1904.09206
Document Type :
Working Paper
Full Text :
https://doi.org/10.1016/j.ijplas.2019.04.012