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High-energy coherent X-ray diffraction microscopy of polycrystal grains: first steps towards a multi-scale approach

Authors :
Maddali, Siddharth
Park, Jun-Sang
Sharma, Hemant
Shastri, Sarvjit
Kenesei, Peter
Almer, Jonathan
Harder, Ross
Highland, Matthew J.
Nashed, Youssef S. G.
Hruszkewycz, Stephan O.
Source :
Phys. Rev. Applied 14, 024085 (2020)
Publication Year :
2019

Abstract

We present proof-of-concept imaging measurements of a polycrystalline material that integrate the elements of conventional high-energy X-ray diffraction microscopy with coherent diffraction imaging techniques, and that can enable in-situ strain-sensitive imaging of lattice structure in ensembles of deeply embedded crystals over five decades of length scale upon full realization. Such multi-scale imaging capabilities are critical to addressing important questions in a variety of research areas such as materials science and engineering, chemistry, and solid state physics. Towards this eventual goal, the following key aspects are demonstrated: 1) high-energy Bragg coherent diffraction imaging (HE-BCDI) of sub-micron-scale crystallites at 52 keV at current third-generation synchrotron light sources, 2) HE-BCDI performed in conjunction with far-field high-energy diffraction microscopy (ff-HEDM) on the grains of a polycrystalline sample in an smoothly integrated manner, and 3) the orientation information of an ensemble of grains obtained via ff-HEDM used to perform complementary HE-BCDI on multiple Bragg reflections of a single targeted grain. These steps lay the foundation for integration of HE-BCDI, which typically provides a spatial resolution tens of nanometers, into a broad suite of well-established HEDM methods, extending HEDM beyond the few-micrometer resolution bound and into the nanoscale, and positioning the approach to take full advantage of the orders-of-magnitude improvement of X-ray coherence expected at fourth generation light sources presently being built and commissioned worldwide.<br />Comment: 11 pages, 7 figures

Details

Database :
arXiv
Journal :
Phys. Rev. Applied 14, 024085 (2020)
Publication Type :
Report
Accession number :
edsarx.1903.11815
Document Type :
Working Paper
Full Text :
https://doi.org/10.1103/PhysRevApplied.14.024085