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Unique thickness-dependent properties of the van der Waals interlayer antiferromagnet $\mathrm{MnBi_2Te_4}$ films

Authors :
Otrokov, Mikhail M.
Rusinov, Igor P.
Blanco-Rey, María
Hoffmann, Martin
Vyazovskaya, Alexandra Yu.
Eremeev, Sergey V.
Ernst, Arthur
Echenique, Pedro M.
Arnau, Andrés
Chulkov, Evgueni V.
Source :
Phys. Rev. Lett. 122, 107202 (2019)
Publication Year :
2018

Abstract

Using density functional theory and Monte Carlo calculations, we study the thickness dependence of the magnetic and electronic properties of a van der Waals interlayer antiferromagnet in the two-dimensional limit. Considering $\mathrm{MnBi_2Te_4}$ as a model material, we find it to demonstrate a remarkable set of thickness-dependent magnetic and topological transitions. While a single septuple layer block of $\mathrm{MnBi_2Te_4}$ is a topologically trivial ferromagnet, the thicker films made of an odd (even) number of blocks are uncompensated (compensated) interlayer antiferromagnets, which show wide bandgap quantum anomalous Hall (zero plateau quantum anomalous Hall) states. Thus, $\mathrm{MnBi_2Te_4}$ is the first stoichiometric material predicted to realize the zero plateau quantum anomalous Hall state intrinsically. This state has been theoretically shown to host the exotic axion insulator phase.

Details

Database :
arXiv
Journal :
Phys. Rev. Lett. 122, 107202 (2019)
Publication Type :
Report
Accession number :
edsarx.1810.05289
Document Type :
Working Paper
Full Text :
https://doi.org/10.1103/PhysRevLett.122.107202