Cite
Atomic Layer deposition of 2D and 3D standards for quantitative synchrotron-based composition and structural analysis methods
MLA
Becker, Nicholas G., et al. Atomic Layer Deposition of 2D and 3D Standards for Quantitative Synchrotron-Based Composition and Structural Analysis Methods. 2017. EBSCOhost, widgets.ebscohost.com/prod/customlink/proxify/proxify.php?count=1&encode=0&proxy=&find_1=&replace_1=&target=https://search.ebscohost.com/login.aspx?direct=true&site=eds-live&scope=site&db=edsarx&AN=edsarx.1705.08403&authtype=sso&custid=ns315887.
APA
Becker, N. G., Butterworth, A., Sokolov, A., Salome, M., Sutton, S., Vincent, D. A., Westphal, A., & Proslier, T. (2017). Atomic Layer deposition of 2D and 3D standards for quantitative synchrotron-based composition and structural analysis methods.
Chicago
Becker, Nicholas G., Anna Butterworth, Andrey Sokolov, Muriel Salome, Steven Sutton, De Andrade Vincent, Andrew Westphal, and Thomas Proslier. 2017. “Atomic Layer Deposition of 2D and 3D Standards for Quantitative Synchrotron-Based Composition and Structural Analysis Methods.” http://widgets.ebscohost.com/prod/customlink/proxify/proxify.php?count=1&encode=0&proxy=&find_1=&replace_1=&target=https://search.ebscohost.com/login.aspx?direct=true&site=eds-live&scope=site&db=edsarx&AN=edsarx.1705.08403&authtype=sso&custid=ns315887.