Design and Test of Wire-Scanners for SwissFEL

Authors :: Orlandi, G. L.
Baldinger, M.
Brands, H.
Heimgartner, P.
Ischebeck, R.
Kammerer, A.
Löhl, F.
Lüscher, R.
Mohanmurthy, P.
Ozkan, C.
Schlott, V.
Schulz, L.
Rippstein, B.
Seiler, C.
Trovati, S.
Valitutti, P.
Zimoch, D.
Source :: ISBN 978-3-95450-133-5 (2014), http://accelconf.web.cern.ch/AccelConf/FEL2014/papers/proceed.pdf
Publication Year :: 2016
Abstract: The SwissFEL light-facility will provide coherent X-rays in the wavelength region 7-0.7 nm and 0.7-0.1 nm. In SwissFEL, view-screens and wire-scanners will be used to monitor the transverse profile of a 200/10pC electron beam with a normalized emittance of 0.4/0.2 mm.mrad and a final energy of 5.8 GeV. Compared to view screens, wire-scanners offer a quasi-non-destructive monitoring of the beam transverse profile without suffering from possible micro-bunching of the electron beam. The main aspects of the design, laboratory characterization and beam-test of the SwissFEL wire-scanner prototype will be discussed.<br />Comment: Proceedings of the 36th International Free Electron Laser Conference, 2014 (5 pages, 7 figures)

Subjects :: Physics - Instrumentation and Detectors
Physics - Accelerator Physics

Database :: arXiv
Journal :: ISBN 978-3-95450-133-5 (2014), http://accelconf.web.cern.ch/AccelConf/FEL2014/papers/proceed.pdf
Publication Type :: Report
Accession number :: edsarx.1611.00151
Document Type :: Working Paper

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