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Quantitative analysis of intermediately and infinitely thick samples with thin sample approach without sample preparation using confocal X-ray fluorescence

Authors :
Sun, Xue-Peng
Liu, Zhi-Guo
Sun, Tian-Xi
Peng, Song
Sun, Wei-Yuan
Li, Fang-Zuo
Jiang, Bo-Wen
Ma, Yong-Zhong
Ding, Xun-Liang
Publication Year :
2015

Abstract

In order to validate that the confocal X-ray fluorescence had potential applications in analyzing the intermediately and infinitely thick samples with thin sample approach without sample preparations, as an example, the confocal X-ray fluorescence based on polycapillary X-ray optics was used to analyze multi elements solutions.<br />Comment: Submited to Chinese Physics C

Subjects

Subjects :
Physics - Optics

Details

Database :
arXiv
Publication Type :
Report
Accession number :
edsarx.1505.07530
Document Type :
Working Paper