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Influence of monolayer contamination on electric-field-noise heating in ion traps

Influence of monolayer contamination on electric-field-noise heating in ion traps

Authors :
Safavi-Naini, A.
Kim, E.
Weck, P. F.
Rabl, P.
Sadeghpour, H. R.
Publication Year :
2012

Abstract

Electric field noise is a hinderance to the assembly of large scale quantum computers based on entangled trapped ions. Apart from ubiquitous technical noise sources, experimental studies of trapped ion heating have revealed additional limiting contributions to this noise, originating from atomic processes on the electrode surfaces. In a recent work [A. Safavi-Naini et al., Phys. Rev. A 84, 023412 (2011)] we described a microscopic model for this excess electric field noise, which points a way towards a more systematic understanding of surface adsorbates as progenitors of electric field jitter noise. Here, we address the impact of surface monolayer contamination on adsorbate induced noise processes. By using exact numerical calculations for H and N atomic monolayers on an Au(111) surface representing opposite extremes of physisorption and chemisorption, we show that an additional monolayer can significantly affect the noise power spectrum and either enhance or suppress the resulting heating rates.<br />Comment: 8 pages, 5 figures

Details

Database :
arXiv
Publication Type :
Report
Accession number :
edsarx.1210.0044
Document Type :
Working Paper
Full Text :
https://doi.org/10.1103/PhysRevA.87.023421