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Robust formation of skyrmions and topological Hall effect in epitaxial thin films of MnSi
- Publication Year :
- 2012
-
Abstract
- Magneto-transport properties have been investigated for epitaxial thin films of B20-type MnSi grown on Si(111) substrates. Both Lorentz transmission electron microscopy (TEM) images and topological Hall effect (THE) clearly point to the robust formation of skyrmions over a wide temperature-magnetic field region. New features distinct from those of bulk MnSi are observed for epitaxial MnSi films: a shorter (nearly half) period of the spin helix and skyrmions, and an opposite sign of THE. These observations suggest versatile features of skyrmion-induced THE beyond the current understanding.
Details
- Database :
- arXiv
- Publication Type :
- Report
- Accession number :
- edsarx.1209.4480
- Document Type :
- Working Paper
- Full Text :
- https://doi.org/10.1103/PhysRevLett.110.117202