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Single-electron latch with granular film charge leakage suppressor

Authors :
Orlov, Alexei O.
Luo, Xiangning
Yadavalli, Kameshwar K.
Beloborodov, Igor S.
Snider, Gregory L.
Source :
Phys. Rev. B 77, 075414 (2008)
Publication Year :
2007

Abstract

A single-electron latch is a device that can be used as a building block for Quantum-dot Cellular Automata (QCA) circuits. It consists of three nanoscale metal "dots" connected in series by tunnel junctions; charging of the dots is controlled by three electrostatic gates. One very important feature of a single-electron latch is its ability to store ("latch") information represented by the location of a single electron within the three dots. To obtain latching, the undesired leakage of charge during the retention time must be suppressed. Previously, to achieve this goal, multiple tunnel junctions were used to connect the three dots. However, this method of charge leakage suppression requires an additional compensation of the background charges affecting each parasitic dot in the array of junctions. We report a single-electron latch where a granular metal film is used to fabricate the middle dot in the latch which concurrently acts as a charge leakage suppressor. This latch has no parasitic dots, therefore the background charge compensation procedure is greatly simplified. We discuss the origins of charge leakage suppression and possible applications of granular metal dots for various single-electron circuits.<br />Comment: 21 pages, 4 figures

Details

Database :
arXiv
Journal :
Phys. Rev. B 77, 075414 (2008)
Publication Type :
Report
Accession number :
edsarx.0709.4002
Document Type :
Working Paper
Full Text :
https://doi.org/10.1103/PhysRevB.77.075414