X-ray Anomalous Scattering of Diluted Magnetic Oxide Semiconductors: Possible Evidence of Lattice Deformation for High Temperature Ferromagnetism

MLA

Matsumura, Takeshi, et al. X-Ray Anomalous Scattering of Diluted Magnetic Oxide Semiconductors: Possible Evidence of Lattice Deformation for High Temperature Ferromagnetism. 2007. EBSCOhost, https://doi.org/10.1103/PhysRevB.76.115320.

APA

Matsumura, T., Okuyama, D., Niioka, S., Ishida, H., Satoh, T., Murakami, Y., Toyosaki, H., Yamada, Y., Fukumura, T., & Kawasaki, M. (2007). X-ray Anomalous Scattering of Diluted Magnetic Oxide Semiconductors: Possible Evidence of Lattice Deformation for High Temperature Ferromagnetism. https://doi.org/10.1103/PhysRevB.76.115320

Chicago

Matsumura, Takeshi, Daisuke Okuyama, Shinya Niioka, Hideaki Ishida, Tadashi Satoh, Youichi Murakami, Hidemi Toyosaki, Yasuhiro Yamada, Tomoteru Fukumura, and Masashi Kawasaki. 2007. “X-Ray Anomalous Scattering of Diluted Magnetic Oxide Semiconductors: Possible Evidence of Lattice Deformation for High Temperature Ferromagnetism.” doi:10.1103/PhysRevB.76.115320.