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WIDEBAND SPECTRAL EMISSION MEASUREMENTS FROM LASER-PRODUCEDPLASMA EUV/SXR SOURCE BASED ON A DOUBLE GAS PUFF TARGET

Authors :
Antony Jose Arikkatt, Przemysław Wachulak, Henryk Fiedorowicz, Andrzej Bartnik,Joanna Czwartos
Source :
METROLOGY AND MEASUREMENT SYSTEMS
Publication Year :
2020

Details

ISSN :
08608229
Database :
OpenAIRE
Journal :
METROLOGY AND MEASUREMENT SYSTEMS
Accession number :
edsair.r3c4b2081b22..c9ea18fff958d53a92a24994a8b15729
Full Text :
https://doi.org/10.24425/mms.2020.134848
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