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Quantitative measurement of mean inner potential and specimen thickness from high-resolution off-axis electron holograms of ultra-thin layered WSe
- Source :
- Ultramicroscopy. 178
- Publication Year :
- 2016
-
Abstract
- The phase and amplitude of the electron wavefunction that has passed through ultra-thin flakes of WSe
Details
- ISSN :
- 18792723
- Volume :
- 178
- Database :
- OpenAIRE
- Journal :
- Ultramicroscopy
- Accession number :
- edsair.pmid..........f70c482d22789480bc31af8bb316670b