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Chemical Vapor Deposition of High-Quality and Atomically Layered ReS₂

Authors :
Xuexia, He
Fucai, Liu
Peng, Hu
Wei, Fu
Xingli, Wang
Qingsheng, Zeng
Wu, Zhao
Zheng, Liu
Source :
Small (Weinheim an der Bergstrasse, Germany). 11(40)
Publication Year :
2015

Abstract

Recently, anisotropic 2D materials, such as black phosphorus and rhenium disulfides (ReS2 ), have attracted a lot attention because of their unique applications on electronics and optoelectronics. In this work, the direct growth of high-quality ReS2 atomic layers and nanoribbons has been demonstrated by using chemical vapor deposition (CVD) method. A possible growth mechanism is proposed according to the controlled experiments. The CVD ReS2-based filed-effect transistors (FETs) show n-type semiconducting behavior with a current on/off ratio of ≈10(6) and a charge carrier mobility of ≈9.3 cm(2) Vs(-1). These results suggested that the quality of CVD grown ReS2 is comparable to mechanically exfoliated ReS2, which is also further supported by atomic force microscopy imaging, high-resolution transmission electron microscopy imaging and thickness-dependent Raman spectra. The study here indicates that CVD grown ReS2 may pave the way for the large-scale fabrication of ReS2-based high-performance optoelectronic devices, such as anisotropic FETs and polarization detection.

Details

ISSN :
16136829
Volume :
11
Issue :
40
Database :
OpenAIRE
Journal :
Small (Weinheim an der Bergstrasse, Germany)
Accession number :
edsair.pmid..........7816de4727e795dcfcff57ea40e587be