Metal contamination detection in nickel induced crystallized silicon by spectroscopic ellipsometry

MLA

Pereira, L., et al. Metal Contamination Detection in Nickel Induced Crystallized Silicon by Spectroscopic Ellipsometry. Jan. 2008. EBSCOhost, widgets.ebscohost.com/prod/customlink/proxify/proxify.php?count=1&encode=0&proxy=&find_1=&replace_1=&target=https://search.ebscohost.com/login.aspx?direct=true&site=eds-live&scope=site&db=edsair&AN=edsair.od......4577..ec3016c46d570e256638dfce0734f4e3&authtype=sso&custid=ns315887.

APA

Pereira, L., Aguas, H., Beckers, M., Martins, R. M. S., & Fortunato, E. (2008). Metal contamination detection in nickel induced crystallized silicon by spectroscopic ellipsometry.

Chicago

Pereira, L., H. Aguas, M. Beckers, R. M. S. Martins, and E. Fortunato. 2008. “Metal Contamination Detection in Nickel Induced Crystallized Silicon by Spectroscopic Ellipsometry,” January. http://widgets.ebscohost.com/prod/customlink/proxify/proxify.php?count=1&encode=0&proxy=&find_1=&replace_1=&target=https://search.ebscohost.com/login.aspx?direct=true&site=eds-live&scope=site&db=edsair&AN=edsair.od......4577..ec3016c46d570e256638dfce0734f4e3&authtype=sso&custid=ns315887.