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Observation of sidearm splitting studied by high resolution X-ray radiography

Authors :
Shevchenko, N.
Grenzer, J.
Keplinger, O.
Rack, A.
Eckert, S.
Source :
International Journal of Materials Research 111(2020)1, 11-16
Publication Year :
2020

Abstract

The local dynamics of dendritic sidearms during the growth stage are studied by in-situ radiography observations at high spatial resolution of < 1 µm. A flat sample of a Ga-In alloy is solidified top-down applying a vertical temperature gradient. The evolving dendritic microstructure is visualized using synchrotron X-ray imaging at the beamline ID19 (ESRF, France). The experimental investigations on the dendrite evolution revealed a transition from a four-fold symmetry to a hyperbranched dendritic morphology. Both, the sidearm-splitting phenomena – responsible for this morphological transition – as well as the arm growth dynamics are characterized by image processing.

Details

Language :
English
Database :
OpenAIRE
Journal :
International Journal of Materials Research 111(2020)1, 11-16
Accession number :
edsair.od......4577..cf47a7640d9348ae8bcf19c6fdaefdfd