Trends in valence band electronic structure of mixed uranium oxides

Valence band electronic structure of mixed uranium oxides (UO2, U4O9, U3O7, U3O8, b-UO3) has been studied by the resonant inelastic X-ray scattering (RIXS) technique at the U M5 edge and by computational methods. We show here that the RIXS technique and recorded U 5f - O 2p charge transfer excitations can be used to proof the validity of theoretical approximations.