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Technology Changes Influence on the Reliability of Medium Voltage Power MOSFET’s in Radiation Environment

Authors :
Busatto, G.
Curro', G.
Iannuzzo, Francesco
Porzio, A.
Sanseverino, Annunziata
Velardi, Francesco
Publication Year :
2006

Details

Language :
English
Database :
OpenAIRE
Accession number :
edsair.od......3980..0d873e38d4ae84aecd8ec7ee53c78e89

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