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Evaluation of structural and adhesive properties of Nylon and PTFE alignment films by means of atomic force microscopy

Authors :
Padeletti, G.
Pergolini, S.
Montesperelli, G.
D'Alessandro, Antonio
Campoli, F.
Maltese, Paolo
Publication Year :
2000
Publisher :
Springer Verlag Germany:Tiergartenstrasse 17, D 69121 Heidelberg Germany:011 49 6221 3450, EMAIL: g.braun@springer.de, INTERNET: http://www.springer.de, Fax: 011 49 6221 345229, 2000.

Details

Database :
OpenAIRE
Accession number :
edsair.od......3686..3afbafa4d2c44cb5e8c839939d966ca7