Synchrotron-based non-destructive diffraction-enhanced imaging systems to image walnut at 20 keV Journal of Food Measurement and Characterization

Authors :: Rao, D. V.
Bhaskaraiah, M.
Cesareo, R.
Brunetti, A.
Akatsuka, T.
Yuasa T, .
Zhong, Z. Takeda T.
Gigante, Giovanni Ettore
Publication Year :: 2013
Publisher :: Springer US, 2013.

Subjects :: Synchrotron DEI DEI-CT Walnut Phase-contrast Imaging techniques Food material Non-destructive methods

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