Back to Search
Start Over
Impact of Heavy-Ion Strickes On Minimum size MOSFET with ultra thin gate
- Publication Year :
- 2006
- Subjects :
- MOSFET Reliability
Radiation effects
Oxide Reliability
Subjects
Details
- Language :
- English
- Database :
- OpenAIRE
- Accession number :
- edsair.od......3657..fa6fb8e69b0b7217884cadedc599b39b