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Resistive RF-MEMS Switches Characterization and Reliability

Authors :
Tazzoli, Augusto
Gnudi, A.
Gaddi, R.
Peretti, Vanni
Zanoni, Enrico
Meneghesso, Gaudenzio
Publication Year :
2005

Subjects

Subjects :
MEMS
Radio Frequency
Charge Trapping
reliability

Details

Language :
English
Database :
OpenAIRE
Accession number :
edsair.od......3657..161264fe30f0fd70ae0651f578785277

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Authors Abstract Subjects Details