Back to Search
Start Over
4-state anti-ferroelectric random access memory
- Source :
- Vopson, M & Tan, X 2016, ' 4-state anti-ferroelectric random access memory ', IEEE Electron Device Letters, vol. 37, no. 12, pp. 1551-1554 . https://doi.org/10.1109/LED.2016.2614841
- Publication Year :
- 2016
-
Abstract
- Ferroelectric random access memory (FRAM) is a 2-state non-volatile memory, in which information is digitally encoded using switchable remanent polarization states within a ferroelectric thin film capacitor. Here we propose a novel nonvolatile memory based on anti-ferroelectric polycrystalline ceramics, termed anti-ferroelectric random access memory (AFRAM). The AFRAM memory cell architecture is similar to FRAM, but it requires a more complex operation protocol. Our initial experimental demonstration of the memory effect in antiferroelectric ceramic shows, remarkably, that the AFRAM technology encodes data in both ferroelectric sublattices of the anti-ferroelectric medium. This results in a 4-state non-volatile memory capable of storing 2 digital bits simultaneously, unlike the FRAM technology that has 2-memory states and it is capable to store 1 digital bit per cell.
Details
- Language :
- English
- Database :
- OpenAIRE
- Journal :
- Vopson, M & Tan, X 2016, ' 4-state anti-ferroelectric random access memory ', IEEE Electron Device Letters, vol. 37, no. 12, pp. 1551-1554 . https://doi.org/10.1109/LED.2016.2614841
- Accession number :
- edsair.od......3461..e4889059e39c234691af79e48df9d554
- Full Text :
- https://doi.org/10.1109/LED.2016.2614841