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4-state anti-ferroelectric random access memory

Authors :
Vopson, Melvin
Tan, Xiaoli
Source :
Vopson, M & Tan, X 2016, ' 4-state anti-ferroelectric random access memory ', IEEE Electron Device Letters, vol. 37, no. 12, pp. 1551-1554 . https://doi.org/10.1109/LED.2016.2614841
Publication Year :
2016

Abstract

Ferroelectric random access memory (FRAM) is a 2-state non-volatile memory, in which information is digitally encoded using switchable remanent polarization states within a ferroelectric thin film capacitor. Here we propose a novel nonvolatile memory based on anti-ferroelectric polycrystalline ceramics, termed anti-ferroelectric random access memory (AFRAM). The AFRAM memory cell architecture is similar to FRAM, but it requires a more complex operation protocol. Our initial experimental demonstration of the memory effect in antiferroelectric ceramic shows, remarkably, that the AFRAM technology encodes data in both ferroelectric sublattices of the anti-ferroelectric medium. This results in a 4-state non-volatile memory capable of storing 2 digital bits simultaneously, unlike the FRAM technology that has 2-memory states and it is capable to store 1 digital bit per cell.

Details

Language :
English
Database :
OpenAIRE
Journal :
Vopson, M & Tan, X 2016, ' 4-state anti-ferroelectric random access memory ', IEEE Electron Device Letters, vol. 37, no. 12, pp. 1551-1554 . https://doi.org/10.1109/LED.2016.2614841
Accession number :
edsair.od......3461..e4889059e39c234691af79e48df9d554
Full Text :
https://doi.org/10.1109/LED.2016.2614841