Hibernus++: A Self-Calibrating and Adaptive System for Transiently-Powered Embedded Devices

Authors :: Balsamo, Domenico
Weddell, Alex
Das, Anup
Arreola, Alberto
Brunelli, Davide
Al Hashimi, Bashir
Merrett, Geoff
Benini, Luca
Publication Year :: 2016

Subjects :: Transient analysis Circuit faults, Checkpointing, Batteries, Microcontrollers, Nonvolatile memory
Batteries
Transient analysis Circuit faults
Nonvolatile memory
Checkpointing
Microcontrollers

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