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Modeling sugar cane yield with a process-based model from site to continental scale: uncertainties arising from model structure and parameter values

Authors :
VALADE, A.
CIAIS, P.
VUICHARD, N.
VIOVY, N.
CAUBEL, A.
HUTH, N.
MARIN, F. R.
MARTINÉ, J.-F.
LSCE, CEA-CNRS
CSIRO
FABIO RICARDO MARIN, CNPTIA
Cirad.
Source :
Repositório Institucional da EMBRAPA (Repository Open Access to Scientific Information from EMBRAPA-Alice), Empresa Brasileira de Pesquisa Agropecuária (Embrapa), instacron:EMBRAPA
Publication Year :
2014

Abstract

This study reveals the spatial and temporal patterns of uncertainty variability for a highly parameterized agro-LSM and calls for more systematic uncertainty analyses of such models.

Details

Language :
English
Database :
OpenAIRE
Journal :
Repositório Institucional da EMBRAPA (Repository Open Access to Scientific Information from EMBRAPA-Alice), Empresa Brasileira de Pesquisa Agropecuária (Embrapa), instacron:EMBRAPA
Accession number :
edsair.od......3056..a1fa0dfd63b0e3a32a16aaa5e3ca7ba1